Auto-Detect Epson/HP/Canon Mainboard Tester: Diode, Triode, PNP NPN MOSFET, Capacitor, Resistor

SKU:: AS-TESTER-TC1
UPC:
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MSRP: $69.99

$39.99

— You save $30.00

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Description

Description

Testing tool for printer mainboards: Canon, HP, Epson & any printer on earch. With built-in rechargable Li-on battery! This God-sent multifunction tester can automatically identify elements and automatic detection of pin layout, and automatic switching range. Yes, I know you can do all these with a multimeter but we all have better things to do than figure out what component it is and how to test it. Howe about having a tool that automatically detect the component, test it and let you know if it 's good or not? You don't need to be an electronic expert to work on your mainboard anymore! Watch the video below for how to use it.

Common Epson Markings:

R: resistor
C: Capacitor
TP: Testing Point
L: Inductor Coil
CN: Connector
F: Fuse
G: Oscillator
K: Relay contactor
RT: Thermistor
TH: Thermistor
HT: Heat Sink
IC: Intergrated Circuit
D: Diode
CR: Diode
VR: Breakdown diode
QF: Transistor
B: Base
E: Emitter

Transistor Tester:

Automatic detection of NPN and PNP bipolar transistors, N-channel and P-channel MOSFETs, JFETs, diodes (including double diodes), N- and P-IGBTs, resistors (including potentiometers), inductors, capacitors, thyristors, triacs and battery (0.1-4.5V)

Automatic detection of zener diode(0.01-20V)

Self test with automatic calibration

IR decoder:

Support Hitachi IR coding

IR waveform display

Infrared receiving instruction

Other:

Measurement results using TFT graphic display(160x128)

One key operation

Auto Power Off(Timeout Settable)

Built-in high capacity rechargeable Li-ion Battery

Li-ion Battery voltage detection

Features:

128x128 TFT display
Multi function key
Transistor test area
Zener Diode test area
IR receiver window
Micro USB Charging (no mattery needed)

Things you can test with:

Component	Range	Parameter Description
BJT	-	hFE(DC Current Gain), Ube(Base-Emitter Voltage), Ic(Collector Current), Iceo(Collector Cut-off Current (IB=0)), Ices(Collector short Current), Uf(Forward Voltage of protecting diode) ③
Diode	Forward Voltage <4.50V	Forward Voltage, Diode Capacitance, Ir(Reverse Current) ②
Double Diodes	Forward Voltage <4.50V	Forward Voltage
Zener Diode	0.01-4.50V (Transistor test area)	Forward Voltage, Reverse Voltage
Zener Diode	0.01-20V (Zener Diode test area)	Reverse Voltage
MOSFET	JFET	Cg(Gate Capacitance), Id(Drain Current) at Vgs(Gate to Source Threshold Voltag), Uf(Forward Voltage of protecting diode) ④
	IGBT	Id(Drain Current) at Vgs(Gate to Source Threshold Voltag), Uf(Forward Voltage of protecting diode) ④
	MOSFET	Vt(Gate to Source Threshold Voltag), Cg(Gate Capacitance), Rds(Drain to Source On Resistance), Uf(Forward Voltage of protecting diode) ④
Thyristor	Igt(Gate trigger current )<6mA	Gate trigger voltage
Triac	Igt(Gate trigger current )<6mA	Gate trigger voltage
Capacitor	25pF-100mF	Capacitance, ESR(Equivalent Series Resistance), Vloss ①
Resistor	0.01-50MΩ	Resistance
Inductor	0.01mH-20H	Inductance, DC Resistance ⑤
Battery	0.1-4.5V	Voltage, Battery Polarity